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1:武汉华中理工大学
Published:1994
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Birefringence measurements using overlapping of interference fringes[J]. 1994, (1).
DOI:
Birefringence measurements using overlapping of interference fringes[J]. 1994, (1). DOI:
本文介绍用干涉条纹的重迭与否测量晶体双折射。作者用干涉条纹取代光栅的Talbot像,主要优点是条纹的对比度好。
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