Study for the detection surface defects of the model   by scanning with planar CCD array

doi:10.13741/j.cnki.11-1879/o4.2000.04.015

您当前的位置：

首页 >

文章列表页 >

Study for the detection surface defects of the model by scanning with planar CCD array

更新时间：2025-09-01

- Study for the detection surface defects of the model by scanning with planar CCD array
- Issue 4, Pages: 337-338(2000)
- 作者机构：
  
  1. 1:清华大学精密仪器系,北京,100084
  2. 2:清华大学精密仪器系,北京,100084
  3. 3:清华大学精密仪器系,北京,100084
- 作者简介：
- 基金信息：
- DOI：10.13741/j.cnki.11-1879/o4.2000.04.015
  CLC：
- Published：2000
- 稿件说明：
移动端阅览
Study for the detection surface defects of the model by scanning with planar CCD array[J]. 2000, (4): 337-338.
DOI：

Study for the detection surface defects of the model by scanning with planar CCD array[J]. 2000, (4): 337-338. DOI： 10.13741/j.cnki.11-1879/o4.2000.04.015.

摘要

介绍了用由面阵 CCD组成的单列阵扫描法测量大型显像管玻壳模具的表面裂纹和砂眼等缺陷。同时还介绍了用软件对图像进行拼接的方法

以及采用分维数理论对灰度值进行分割等数据处理技术

并获得了较好的实验结果。由实验结果表明

该方法的分辨率达到了 0 .0 5 mm。

Abstract

关键词

Keywords

references

Views

256

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Application of SUSAN operator in image segmentation of micro bearings surface defect

A device for detecting progressive addition lenses

Extracting characteristic wavebands for radish leaves based on LCTF imaging method

Regional integration time controllable imaging based on DMD

Multiple-beam interference to measure solid linear expansion coefficient

Related Author

陈廉清

袁红彬

王龙山

郑茹

徐丹阳

高建勋

隋成华

曹鹏飞

Related Institution

1:宁波工程学院机械工程学院

2:吉林大学机械科学与工程学院

3:吉林大学机械科学与工程学院

1:杭州市质量技术监督检测院

⁰