南京理工大学 电子工程与光电技术学院,江苏 南京210094
万博艺(2002— ),男,硕士研究生,从事光学精密检测方面研究。w2057354840@163.com
陈磊(1964— ),男,研究员,博士,从事光学精密检测方面研究。chenlei@njust.edu.cn
收稿:2026-03-26,
修回:2026-04-21,
纸质出版:2026-05-20
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万博艺,陈磊,李素田等.基于斐索干涉仪的红外光学材料折射率测量方法[J].光学技术,2026,52(03):295-301.
WAN Boyi,CHEN Lei,LI Sutian,et al.Measurement method of refractive index of infrared optical materials based on fizeau interferometer[J].OPTICAL TECHNIQUE,2026,52(03):295-301.
为精确测量红外材料折射率,保证红外光学系统质量,研究了一种基于斐索红外干涉仪的材料折射率测量方法。将待测样品加工为带有一定楔角的楔形材料,置于斐索干涉仪测试光路中,推动并令其沿自身主截面方向平移,获取干涉条纹移动数量与样品平移距离,以此计算出待测样件的折射率。在22℃环境温度下,测量了硫化锌材料在1550nm波长处的折射率,得到其折射率为2.2719。分析了测量过程中调整误差、楔板楔角测量系统误差、测量误差等因素对测试结果的影响,结果表明本文所提测量方案的测试不确定度为9.48×10
-4
。
To precisely measure the refractive index of infrared materials and ensure the quality of infrared optical systems
a refractive index measurement method based on a Fizeau infrared interferometer is investigated. The sample under test is fabricated into a wedged element with a specific wedge angle and placed in the test arm of the Fizeau interferometer. By translating the sample along the direction of its principal section and recording the number of fringe shifts as well as the corresponding translation distance
the refractive index of the sample can be calculated. At an ambient temperature of 22°C
the refractive index of zinc sulfide material was measured at a wavelength of 1550nm
yielding a value of 2.2719. The influences of adjustment errors during measurement
systematic errors in wedge angle measurement
and other measurement errors on the final result were analyzed. The analysis indicates that the measurement uncertainty of the proposed method is 9.48×10⁻⁴.
张艺 , 胡健钏 , 朱尤攀 , 等 . 短波红外成像系统设计及应用的研究进展 [J ] . 红外技术 , 2024 , 46 ( 03 ): 246 — 255 .
Zhang Yi , Hu Jianchuan , Zhu Youpan , et al . Research progress in the design and application of shortwave infrared imaging systems [J ] . Infrared Technology , 2024 , 46 ( 03 ): 246 — 255 .
张瑞 . InGaAs短波红外低照度成像技术研究及其应用 [D ] . 上海 : 中国科学院大学(中国科学院上海技术物理研究所) , 2021 : 1 — 15 .
Zhang Rui . Research and application of InGaAs shortwave imaging technology under low illumination [D ] . Shanghai : University of Chinese Academy of Sciences (Shanghai Institute of Technical Physics, Chinese Academy of Sciences) , 2021 : 1 — 15 .
胡向平 , 徐光以 , 麦绿波 , 等 . 红外硫系光学玻璃条纹度测量及表征方法研究 [J ] . 红外技术 , 2020 , 42 ( 8 ): 769 — 774 .
Hu Xiangping , Xu Guangyi , Mai Lubo , et al . Measurement and characterization method of striae for infrared chalcogenide optical glass [J ] . Infrared Technology , 2020 , 42 ( 8 ): 769 — 774 .
闫茹梦 . 多波段红外光学成像系统的研究 [D ] . 西安 : 西安工业大学 , 2022 : 44 — 56 .
Yan Rumeng . Research on multi-band infrared optical imaging system [D ] . Xi’an : Xi’an Technological University , 2022 : 44 — 56 .
李亮亮 , 林尤华 , 乔运蒙 , 等 . 玻璃材料折射率温度系数测量方法研究 [J ] . 计量科学与技术 , 2025 , 69 ( 11 ): 11 — 17+33 .
Li Liangliang , Lin Youhua , Qiao Yunmeng , et al . Research on the measurement method of the temperature coefficient of refractive index of glass materials [J ] . Metrology Science and Technology , 2025 , 69 ( 11 ): 11 — 17+33 .
Yurin A I , Vishnyakov G N , Minaev V L , Refractive index measurement using a modified Littrow-Abbe method [J ] . Journal of Optical Technology , 2022 , 89 : 666 — 669 .
Kuiper M , Koops R , Nieuwland R , et al . Method to traceably determine the refractive index by measuring the angle of minimum deviation [J ] . Metrologia , 2022 , 59 ( 5 ): 055006 .
黄一飞 , 袁彪 , 陈冕成 , 等 . 基于3390nm中波红外干涉仪红外材料折射率均匀性测量 [J ] . 光学技术 , 2025 , 51 ( 01 ): 82 — 86 .
Huang Yifei , Yuan Biao , Chen Miancheng , et al . Measurement of refractive index uniformity of infrared materials based on 3390nm mid-wave infrared interferometer [J ] . Optical Technique , 2025 , 51 ( 01 ): 82 — 86 .
许子杰 , 张宝武 , 施江焕 , 等 . Tolansky干涉测量平行透明材料折射率方法探究 [J ] . 光学技术 , 2024 , 50 ( 04 ): 459 — 465 .
Xu Zijie , Zhang Baowu , Shi Jianghuan , et al . Exploring the method of measuring the refractive index of parallel transparent materials by tolansky interferometer [J ] . Optical Technique , 2024 , 50 ( 04 ): 459 — 465 .
International Organization for Standardization . ISO 17328:2021 Optics and photonics-Optical materials and components-Test method for refractive index of infrared optical materials [S ] . Switzerland : ISO , 2021 .
Gemo E , Kesava S V , Ruiz De Galarreta C , et al . Simple technique for determining the refractive index of phase-change materials using near-infrared reflectometry [J ] . Optical Materials Express , 2020 , 10 ( 7 ): 1675 — 1686 .
Vohánka J , Večeře J , Franta D , et al . Determination of refractive index of crystalline silicon in the infrared region on the basis of interference pattern observed in thick slab [J ] . Infrared Physics and Technology , 2025 , 149 : 105889 — 105889 .
刘金龙 . 基于深度学习的近红外光谱鲁棒建模方法研究 [D ] . 无锡 : 江南大学 , 2025 .
Liu Jinlong . Robustness modeling approaches based on near-infrared spectroscopy using deep learning [D ] . Wuxi : Jiangnan University , 2025 .
张瑞峰 , 刘畅 . 分区间曲线拟合的干涉条纹中心点提取方法 [J ] . 激光与光电子学进展 , 2021 , 58 ( 8 ): 0812002 .
Zhang Ruifeng , Liu Chang . Interference fringe center point extraction method based on interval curve fitting [J ] . Laser & Optoelectronics Progress , 2021 , 58 ( 8 ): 0812002 .
张昊 , 韦晓孝 , 范淼 , 等 . 白光干涉信号的分段拟合优化方法研究 [J ] . 光学技术 , 2025 , 51 ( 06 ) : 704 — 709 .
Zhang Hao , Wei Xiaoxiao , Fan Miao , et al . Research on segmented fitting optimization method for white light interference signals [J ] . Optical Technique , 2025 , 51 ( 06 ) : 704 — 709 .
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